Fast electromagnetic characterisation method of thin planar materials using coplanar line up to V-band

Journal ar
Electronics Letters
  • Volumen: 38
  • Número: 8
  • Fecha: 11 abril 2002
  • Páginas: 373-374
  • ISSN: 00135194
  • Tipo de fuente: Revista
  • DOI: 10.1049/el:20020272
  • Tipo de documento: Artículo
A very broadband method for determining the electromagnetic properties of isotropic thin planar materials, which uses a coplanar line as a cell, is presented. The complex permittivity is quickly computed from S-parameter measurements of coplanar cells propagating the dominant mode by using analytical equations. Measurements between 0.05 and 75 GHz of alumina and doped silicon show good agreement between measured and predicted values.

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