Very high broadband electromagnetic characterization method of film-shaped materials using coplanar

A very high broadband method for determining the electromagnetic properties of isotropic film-shaped materials, which uses coplanar lines as cells, is presented. The material tested is the coplanar line substrate. The complex properties are computed from S-parameter measurements of coplanar cells propagating the dominant mode and using analytical relationships, which decrease the computation time. Vector network analyzers and high-quality on-coplanar test fixtures are used for the measurement bench. Measurements for several dielectric materials in the 0.05-110 GHz frequency range show good agreements between measured and predicted data.