S-parameter broadband measurements of microstrip lines and extraction of the substrate intrinsic properties

Journal ar
Microwave and Optical Technology Letters
  • Volumen: 30
  • Número: 1
  • Fecha: 05 julio 2001
  • Páginas: 65-69
  • ISSN: 08952477
  • Tipo de fuente: Revista
  • DOI: 10.1002/mop.1222
  • Tipo de documento: Artículo
A measurement technique for the broadband determination of the complex permittivity and permeability of isotropic film-shaped materials is presented. ¿r and ¿r are computed from S-parameter measurements of microstrip lines propagating in the dominant mode and used as cells. The material under test is the microstrip-line substrate, which is the original feature of this method in comparison with existing techniques. This leads to a simple and reproducible measurement process. Measurements for several materials in the 0.05-40 GHz frequency range show good agreement between measured and predicted data.

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