S-parameter broad-band measurements on-microstrip and fast extraction of the substrate intrinsic properties

Journal ar
IEEE Microwave and Wireless Components Letters
  • Volumen: 11
  • Número: 7
  • Fecha: 01 julio 2001
  • Páginas: 305-307
  • ISSN: 15311309
  • Tipo de fuente: Revista
  • DOI: 10.1109/7260.933779
  • Tipo de documento: Artículo
A broad-band technique for determining the electromagnetic properties of isotropic film-shaped materials, which uses a microstrip line, is presented. Complex permittivity and permeability are computed from analytical equations and S-parameter measurements of microstrip cells propagating the dominant mode. Measured ¿¿ and ¿¿ data for several materials are presented between 0.05 GHz and 40 GHz. This technique shows a good agreement between measured and predicted data.

Palabras clave del autor

    Palabras clave indexadas

      Detalles de financiación