S-parameter broadband measurements on-coplanar and fast extraction of the substrate intrinsic properties

Journal ar
IEEE Microwave and Wireless Components Letters
  • Volumen: 11
  • Número: 2
  • Fecha: 01 febrero 2001
  • Páginas: 80-82
  • ISSN: 15311309
  • Tipo de fuente: Revista
  • DOI: 10.1109/7260.914309
  • Tipo de documento: Artículo
A broadband technique for determining the electro-magnetic properties of isotropic thin-film materials, which uses a coplanar line, is presented. Complex permittivity and permeability are computed from S-parameter measurements of a coplanar cell propagating the dominant mode. Measured ¿r and ¿r data for several materials are presented between 0.05 GHz and 40 GHz. This technique shows a good agreement between measured and predicted data.

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