Ridged waveguide to microstrip transition for electromagnetic characterization of materials in V-band

Journal ar
Electronics Letters
  • Volumen: 36
  • Número: 17
  • Fecha: 17 agosto 2000
  • Páginas: 1468-1470
  • ISSN: 00135194
  • Tipo de fuente: Revista
  • DOI: 10.1049/el:20001067
  • Tipo de documento: Artículo
  • Editorial: IEE Stevenage, United Kingdom
A high-quality ridged waveguide to microstrip transition for determining the electromagnetic characteristics of thin-film materials in the V-band is presented. Complex permittivity and permeability are computed from S-parameter measurements of a microstrip cell propagating the dominant mode. Measurements in V-band of alumina show good agreement between measured and predicted values.

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