Compact double notch coplanar and microstrip bandstop filters using metamaterial¿inspired open ring resonators

ISSN: 20799292

Electronics (Switzerland)

Design of high-performance microstrip and coplanar low-pass filters based on electromagnetic bandgap (EBG) structures

ISSN: 16180399 14348411

AEU - International Journal of Electronics and Communications

Teaching-learning model for the science of electronics

ISSN: 20136374 20145349

Journal of Technology and Science Education

Compact Bandstop Half-Mode Substrate Integrated Waveguide Filter Based on a Broadside-Coupled Open Split-Ring Resonator

ISSN: 00189480

IEEE Transactions on Microwave Theory and Techniques

Tunable ferroelectrics for frequency agile microwave and THz devices

ISBN: 9780128111802

Magnetic, Ferroelectric, and Multiferroic Metal Oxides

Reconfigurable coplanar waveguide (CPW) and half-mode substrate integrated waveguide (HMSIW) band-stop filters using a varactor-loaded metamaterial-inspired open resonator

ISSN: 19961944

Materials

Electronically tunable microstrip bandstop filters using a varactor-loaded open ring resonator (VLORR)

ISSN: 14320630 09478396

Applied Physics A: Materials Science and Processing

Modified split-ring resonator for microstrip dual-band notch filter

ISBN: 9782874870392

European Microwave Week 2015: "Freedom Through Microwaves", EuMW 2015 - Conference Proceedings; 2015 45th European Microwave Conference Proceedings, EuMC

Optimization of chirped and tapered microstrip Koch fractal electromagnetic band gap (KFEBG) structures for improved low-pass filter design

ISSN: 1751-8725

IET Microwaves, Antennas and Propagation

Substrate integrated waveguide (SIW) with Koch fractal electromagnetic bandgap structures (KFEBG) for bandpass filter design

ISSN: 15311309

IEEE Microwave and Wireless Components Letters

Optimisation of chirped and tapered microstrip Koch fractal electromagnetic bandgap structures for improved low-pass filter design

ISSN: 17518733 17518725

IET Microwaves, Antennas and Propagation

Low-frequency CMOS bandpass filter for PIR sensors in wireless sensor nodes

ISSN: 1530437X

IEEE Sensors Journal

Ambient assisted living system with capacitive occupancy sensor

ISSN: 14680394 02664720

Expert Systems

A flat-passband and wide-stopband low-pass filter based on tapered Cauchy microstrip Koch fractal EBG structure

ISBN: 9781479934522

2014 8th International Congress on Advanced Electromagnetic Materials in Microwaves and Optics, METAMATERIALS 2014

Dielectric constant tunability at microwave frequencies and pyroelectric behavior of lead-free submicrometer-structured (Bi0.5Na 0.5)1-xBaxTiO3 ferroelectric ceramics

ISSN: 08853010

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

An energy efficient middleware for an ad-hoc AAL wireless sensor network

ISSN: 15708705

Ad Hoc Networks

EMFi-based low-power occupancy sensor

ISSN: 09244247

Sensors and Actuators, A: Physical

A fourth order CMOS band pass filter for PIR sensors

ISBN: 9781467312615

2012 19th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2012

Pyroelectric and dielectric properties of ferroelectric ceramics for microwave tunable devices and infrared detector applications

ISBN: 9781467326681

Proceedings of 2012 21st IEEE Int. Symp. on Applications of Ferroelectrics held jointly with 11th IEEE European Conference on the Applications of Polar Dielectrics and IEEE PFM, ISAF/ECAPD/PFM 2012

A system for ubiquitous fall monitoring at home via a wireless sensor network and a wearable mote

ISSN: 09574174

Expert Systems with Applications

Novel compact wide-band ebg structure based on tapered 1-D Koch fractal patterns

ISSN: 15361225

IEEE Antennas and Wireless Propagation Letters

1-D Koch fractal electromagnetic bandgap microstrip structure with r/a ratios higher than 0.5

ISSN: 0895-2477

Microwave and Optical Technology Letters

1D Koch fractal electromagnetic bandgap microstrip structures with r/a ratios higher than 0.5

ISSN: 08952477 10982760

Microwave and Optical Technology Letters

Estudio de la estabilidad térmica del nitruro de silicio amorfo hidrogenado producido mediante la técnica de plasma ECR-CVD

ISBN: 978-1-109-568424

ProQuest

Photonic crystals (PC) in diamond: Ultra-high-Q nanocavity design, analysis and fabrication

ISBN: 9789038613178

ECIO'08 Eindhoven - Proceedings of the 14th European Conference on Integrated Optics and Technical Exhibition, Contributed and Invited Papers

Physical properties of high pressure reactively sputtered hafnium oxide

ISSN: 0042207X

Vacuum

Optical properties and structure of HfO2 thin films grown by high pressure reactive sputtering

ISSN: 00223727 13616463

Journal of Physics D: Applied Physics

High-pressure reactively sputtered Hf O2: Composition, morphology, and optical properties

ISSN: 00218979

Journal of Applied Physics

Compositional analysis of polycrystalline hafnium oxide thin films by heavy-ion elastic recoil detection analysis

ISSN: 00406090

Thin Solid Films

Compositional analysis of polycrystalline hafnium oxide films by HI-ERDA and infrared spectroscopy

ISSN: 1610-0638

HMI-Bericht B

Crecimiento y caracterización de láminas delgadas de dieléctricos de alta permitividad para su aplicación en la estructura de puerta de transistores de efecto campo

ISSN: 1698-2924

Teleco-Forum

Bonding structure and hydrogen content in silicon nitride thin films deposited by the electron cyclotron resonance plasma method

ISSN: 00406090

Thin Solid Films

Rapid thermally annealed plasma deposited SiNx:H thin films: Application to metal-insulator-semiconductor structures with Si, In 0.53Ga0.47 As, and InP

ISSN: 00218979

Journal of Applied Physics

Microstructural modifications induced by rapid thermal annealing in plasma deposited SiOxNyHz films

ISSN: 00218979

Journal of Applied Physics

Rapid thermal annealing effects on the electrical behavior of plasma oxidized silicon/silicon nitride stacks gate insulators

ISSN: 10711023

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Characterization of nitrogen-rich silicon nitride films grown by the electron cyclotron resonance plasma technique

ISSN: 02681242

Semiconductor Science and Technology

Rapid thermal annealing effects on the electrical behavior of plasma oxidized silicon/silicon nitride stacks gate insulators

ISSN: 10711023

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Optical and structural properties of SiOxNyHz films deposited by electron cyclotron resonance and their correlation with composition

ISSN: 00218979

Journal of Applied Physics

Physical properties of plasma deposited SiOx thin films

ISSN: 0042207X

Vacuum

Composition and optical properties of silicon oxynitride films deposited by electron cyclotron resonance

ISSN: 0042207X

Vacuum

Rapid thermal annealing effects on plasma deposited SiOx:H films

ISSN: 0042207X

Vacuum

Molecular models and activation energies for bonding rearrangement in plasma-deposited ¿-SiNx: H dielectric thin films treated by rapid thermal annealing

ISSN: 01631829

Physical Review B - Condensed Matter and Materials Physics

Characterization of polycrystalline Cu(In,Ga)Te2 thin films prepared by pulsed laser deposition

ISSN: 00406090

Thin Solid Films

Temperature effects on the electrical properties and structure of interfacial and bulk defects in Al/SiNx:H/Si devices

ISSN: 00218979

Journal of Applied Physics

Electrical properties of rapid thermally annealed SiNx:H/Si structures characterized by capacitance-voltage and surface photovoltage spectroscopy

ISSN: 02681242

Semiconductor Science and Technology

Lattice recovery by rapid thermal annealing in Mg⁺-implanted InP assessed by Raman spectroscopy

ISSN: 0168583X

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Defect structure of SiNx:H films and its evolution with annealing temperature

ISSN: 00218979

Journal of Applied Physics

Compositional analysis of amorphous SiNx:H films by ERDA and infrared spectroscopy

ISSN: 01422421

Surface and Interface Analysis

Rapid thermal annealing effects on the structural properties and density of defects in SiO2 and SiNx: H films deposited by electron cyclotron resonance

ISSN: 00218979

Journal of Applied Physics

Optical absorption in amorphous hydrogenated silicon nitride thin films deposited by the electron cyclotron resonance plasma method and subjected to rapid thermal annealing

ISSN: 00406090

Thin Solid Films

Photovoltage effects under sinusoidal illumination

ISSN: 00218979

Journal of Applied Physics

Thermally induced changes in the optical properties of SiNx:H films deposited by the electron cyclotron resonance plasma method

ISSN: 00218979

Journal of Applied Physics

Fabrication and characterisation of thin low-temperature MBE-compatible silicon oxides of different stoichiometry

ISSN: 00406090

Thin Solid Films

Effect of substrate temperature in SiOxNy films deposited by electron cyclotron resonance

ISSN: 07342101

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Thermal stability of a-SiNx:H films deposited by plasma electron cyclotron resonance

ISSN: 07342101

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Influence of rapid thermal annealing processes on the properties of SiNx:H films deposited by the electron cyclotron resonance method

ISSN: 00223093

Journal of Non-Crystalline Solids

An undergraduate experiment: The determination of the structure of Ge and Si based bipolar transistors

ISSN: 00207209

International Journal of Electrical Engineering Education