Permittivity characterization from open-end microstrip line measurements

Journal ar
Microwave and Optical Technology Letters
  • Volumen: 49
  • Número: 6
  • Fecha: 01 June 2007
  • Páginas: 1371-1374
  • ISSN: 08952477
  • Source Type: Journal
  • DOI: 10.1002/mop.22410
  • Document Type: Article
A broad-band method for measuring the complex permittivity of isotropic film-shaped materials at low microwave frequencies is presented. The characterized material is the substrate of an open-end microstrip line used as sample-cell. Complex permittivity is computed from S11 reflection parameter measurement of open-end microstrip cell using analytical relationships, which decrease the computation time. Vector network analyzer and high-quality on-microstrip test fixture are used for the measurement bench. Measurements over 0.01 GHz-3 GHz frequency range with several nonmagnetic materials show good agreements between measured and predicted results. © 2007 Wiley Periodicals, Inc.

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