Very high broadband electromagnetic characterization method of film-shaped materials using coplanar

  • J. Hinojosa /
  • K. Lmimouni /
  • S. Lepilliet /
  • G. Dambrine
Journal ar
Microwave and Optical Technology Letters
  • Volumen: 33
  • Número: 5
  • Fecha: 05 June 2002
  • Páginas: 352-355
  • ISSN: 08952477
  • Source Type: Journal
  • DOI: 10.1002/mop.10319
  • Document Type: Article
A very high broadband method for determining the electromagnetic properties of isotropic film-shaped materials, which uses coplanar lines as cells, is presented. The material tested is the coplanar line substrate. The complex properties are computed from S-parameter measurements of coplanar cells propagating the dominant mode and using analytical relationships, which decrease the computation time. Vector network analyzers and high-quality on-coplanar test fixtures are used for the measurement bench. Measurements for several dielectric materials in the 0.05-110 GHz frequency range show good agreements between measured and predicted data.

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